Jian Wang, Dr., Prof., High-level Talent of Hubei Province, National-level Young Talent for Metrology, received his BEng and PhD degrees, respectively, from the University of Science and Technology of China (USTC) in 2008 and the University of Huddersfield, UK, in 2013. After that, he conducted postdoctoral research at the National Physical Laboratory (NPL), UK, before joining HUST in 2015. His research focuses on optical metrology of complex surfaces & interfaces for advanced manufacturing and integrated circuits. He has published more than 70 papers in renowned journals such as IEEE TMECH/TIM and ADV ENG INFOM. He is an expert in ISO TC201 for Surface Chemical Analysis and SAC/TC240 for Geometrical Product Specifications, Deputy Secretary-General of the National Association for Interchangeability and Measurement Technology, committee member of the Chinese Optical Society (STC Optical test), secretary of the Chinese Society of Optical Engineering (STC micro/nano metrology), and a guest editor of SENSORS. He was nominated as an Emerging Leader of Surf. Topogr. Metrol. Prop. awarded by the Institute of Physics, 2021.