Function Introduction:

This instrument is primarily used for analyzing the temperature-dependent optical properties and structural characteristics of various functional materials and bulk materials in fields such as nanofabrication, nanomaterials science, and nanobiology. It enables the analysis of optical constants for informational optoelectronic materials and devices. Measured objects include metals, semiconductors, superconductors, insulators, amorphous materials, magnetic materials, electro-optic materials, nonlinear materials, as well as isotropic and anisotropic materials.

Main Technical Parameters:

1. Capable of one-time measurement of the complete 4x4 Mueller matrix (all 16 elements) .

2. Spectral range: 193 - 1700 nm.

3. Incident angle of the probe beam: 55°.

4. Micro-spot diameter: 200 μm.

5. Repetitive measurement error: < 0.005 nm.

6. Variable temperature range: 80 - 873 K.

7. Maximum heating rate: 130 K/min.

8. Maximum cooling rate: -50 K/min.

9. Temperature stability: ±0.05 K .